Applied Nanostructures

10/10/2016

space available - see us on LoopNet...

415 Clyde Ave, Mountain View, CA 94043

10/10/2016

AppNano Wafer with inset

22/03/2013

We are now offering free FedEx Ground shipping on all orders placed through our online store.

18/03/2013

Applied Nanostructures has moved! Here is our new address:

415 Clyde Avenue, Suite 102
Mountain View, CA 94043
Ph: 650-988-9880
Fax: 408-516-4917

Please update your records!

04/03/2013

Probe of the Month: SHS

Applied NanoStructures' Step Height Standards are uniquely designed for X, Y, and Z calibration of scanning probe microscopes and profilometers. Our Step Height Standard features are defined in thermally grown silicon dioxide on silicon substrate, with an optional layer of Cr deposited to harden the surface. SHS products are available in heights of 1 µm and 100 nm.

http://appnano.com/products/shs/

04/02/2013

Probe of the Month: FCL

AppNano FCL probes are tipless force calibration probes designed for spring constant calibration of SPM probes. Each probe comes with five different cantilevers, with spring constants ranging from 0.12 N/m to 77 N/m. FCL probes can be ordered with or without aluminum coating on the reflex side. http://appnano.com/products/silicon/fcl/fcl

02/01/2013

Probe of the Month: ACCESS-C

AppNano ACCESS-C™ probes are the contact mode model of our popular ACCESS series. ACCESS probes are sharp silicon probes that allow a direct optical view of the AFM tip. This series was specially designed for applications that require seeing the tip as it engages the surface, and all ACCESS probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging. ACCESS-C probes can be ordered with or without aluminum coating on the reflex side.

21/12/2012

05/12/2012

ACCESS-UHF Fast-Scan Series has been renamed - you can now find these probes listed under ACCESS-UHF Fast Scanning Probes. The part numbers are still the same, though.

03/12/2012

Probe of the Month: MAGT

MAGT probes are silicon probes specially designed for Magnetic Force Microscopy (MFM) applications, offering superior imaging capability. The reflex and tip sides of the probe are coated with Cr/Co magnetic coating. MAGT probes can be ordered with low, medium, or high moment; all three options have medium coercivity.

http://appnano.com/products/silicon/magt/

27/11/2012

Booth 1206, our home at MRS.

26/11/2012

The 2013 AppNano Catalog is now available! Check out the PDF on our website today!http://appnano.com/static/pub/documents/2013-catalog.pdf